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Applied Physics Reviews — 1987


Scanning tunneling microscopy

Paul K. Hansma and Jerry Tersoff

J. Appl. Phys. 61, R1 (1987); http://dx.doi.org/10.1063/1.338189 (24 pages)

Online Publication Date: 12 December 2006

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A scanning tunneling microscope (STM) can provide atomic‐resolution images of samples in ultra‐high vacuum, moderate vacuum, gases including air at atmospheric pressure, and liquids including oil, water, liquid nitrogen, and even conductive solutions. This review contains images of single‐crystal metals, metal films, both elemental and compound semiconductors, superconductors, layered materials, adsorbed atoms, and even DNA. A discussion of results on lithography leads into speculations on a bright future in which STMs may not only observe, but also manipulate surfaces, right down to the atomic level.
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07.79.Cz Scanning tunneling microscopes
61.05.-a Techniques for structure determination
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
68.35.B- Structure of clean surfaces (and surface reconstruction)
81.65.-b Surface treatments

Fractal aspects of the dielectric response of charge carriers in disordered materials

G. A. Niklasson

J. Appl. Phys. 62, R1 (1987); http://dx.doi.org/10.1063/1.339355 (14 pages)

Online Publication Date: 12 December 2006

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We put forward a fractal model for the anomalous low‐frequency dispersion in the dielectric properties of materials. This dispersion consists of two fractional power laws in the frequency domain. We review the theory of the dielectric response due to fractal time processes and conduction on fractal structures. A fractal time process can arise from multiple trapping and trap‐controlled hopping. The most studied fractal structure is percolation clusters. The anomalous low‐frequency dispersion can be modeled by considering a combination of a fractal time process and a fractal structure. The power law at low frequencies is due to the fractal time process, while the high‐frequency power law depends on both the conduction on the fractal structure and the fractal time process. The crossover between the two power laws corresponds to the correlation length of the material. We have compared this model to available experimental data. Experiments show the qualitative features predicted by the fractal model, but quantitative agreement is lacking in many cases. Even for percolation systems at the percolation threshold, discrepancies are apparent. This points to the need for further refinements of the theory. Some possible reasons for the discrepancies are pointed out.
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77.22.Ch Permittivity (dielectric function)
77.22.Gm Dielectric loss and relaxation
72.20.Dp General theory, scattering mechanisms

Physics of ferromagnetic amorphous alloys

R. C. O’Handley

J. Appl. Phys. 62, R15 (1987); http://dx.doi.org/10.1063/1.339065 (35 pages)

Online Publication Date: 12 December 2006

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After some introductory comments on materials classification and a brief historical outline, this review seeks to identify those fundamental physical phenomena that underlie the major technical properties of ferromagnetic amorphous alloys. Those phenomena are reviewed and an attempt is made to compare existing data and, where possible, to synthesize new perspectives. A fundamental approach is taken in the sense that we move from consideration of the local atomic structure to its consequences for the electronic structure and from the electronic structure finally to the physical properties it determines. We focus on the aspects of the structure‐property sequence that set amorphous metallic alloys apart from their crystalline counterparts. Such a review would be incomplete without addressing the new issues and insights raised by the discovery of the quasicrystalline state. The very existence and better understood atomic arrangements of quasicrystals help to define and illuminate their amorphous cousins.
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75.50.Kj Amorphous and quasicrystalline magnetic materials
61.43.Fs Glasses
61.43.-j Disordered solids
75.30.-m Intrinsic properties of magnetically ordered materials
71.23.-k Electronic structure of disordered solids

Linear relaxation: Distributions, thermal activation, structure, and ambiguity

J.Ross Macdonald

J. Appl. Phys. 62, R51 (1987); http://dx.doi.org/10.1063/1.339013 (12 pages)

Online Publication Date: 12 December 2006

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The equations governing the small‐signal response of relaxing, nonresonant systems which may be described by a distribution of relaxation times (DRT) and/or a distribution of activation energies (DAE) are summarized and generalized and their implications discussed for several popular distributions. Much past work, both experimental and theoretical, associated with these distributions is discussed. A distinction is made between physically realistic distributions, which involve finite shortest and longest relaxation times, and the usual mathematical approaches which involve limiting zero and infinite relaxation times. The Lévy DRT, which is of the latter character and which leads to the popular stretched exponential (SE) time and Williams–Watts (WW) frequency responses, is inconsistent with a temperature‐independent DAE, reducing its range of applicability for a thermally activated situation. The SE‐WW response has been termed universal; it is not, both because of the above facts and also because it does not lead to the often found symmetrical log‐frequency response. Both Gaussian and exponential DAEs can lead to both symmetrical and skewed results, and can involve either temperature‐dependent or temperature‐independent DAEs. However, the Gaussian DAE does not yield fractional power‐law time or frequency response over a finite, nonzero range, behavior found in nearly all distributed data. However, all DAEs involving exponential probability densities do lead to such behavior and provide, as well, an explanation of the temperature dependence of power‐law exponents. In addition, it appears that the response of systems involving an exponential DAE can fit that of virtually all previous models, including the SE‐WW, and thus can fit all data for thermally activated systems which have been fitted by these models. Problems in data fitting and many sources and types of ambiguity and their resolution are discussed. Special attention is devoted to the distinction between parallel, sequential, and hierarchical microscopic‐model structure and response, and the various different, but, surprisingly, equivalent ways the overall response can be represented mathematically or by means of equivalent circuits of different connectivity.
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77.22.Gm Dielectric loss and relaxation
81.90.+c Other topics in materials science (restricted to new topics in section 81)
62.90.+k Other topics in mechanical and acoustical properties of condensed matter (restricted to new topics in section 62)
72.15.Lh Relaxation times and mean free paths
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