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Applied Physics Reviews — 1993


Frequency control of semiconductor lasers

M. Ohtsu, K. Nakagawa, M. Kourogi, and W. Wang

J. Appl. Phys. 73, R1 (1993); http://dx.doi.org/10.1063/1.353354 (17 pages)

Online Publication Date: 12 December 2006

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This article reviews our recent works on frequency control of semiconductor lasers. The magnitudes of quantum noise limited frequency modulation (FM) noise, realized by the negative electrical feedback, are given for four methods of using an external Fabry–Perot cavity as a frequency demodulator. It is shown that the theoretical expression for the quantum noise‐limited FM noise of the feedback laser contains a factor of 1/8 as compared with that of the free running laser, which is due to the different ways of injecting the vacuum fluctuations to the laser cavity and to the external Fabry–Perot cavity for negative electrical feedback. The FM sideband technique is shown to be an effective method to reject the contribution of laser power fluctuations to the FM noise detection for the negative electrical feedback system. As a candidate for a high reflectivity and frequency selective external reflector for the optical feedback, characteristics of the semiconductor laser as a phase conjugate mirror, i.e., the characteristics of the nearly degenerate four‐wave mixing and the nondegenerate four‐wave mixing in a semiconductor laser, are shown. Optical feedback by using a velocity selective optical pumping and polarization spectroscopy of an atomic vapor is proposed as an effective method to realize simultaneously the center frequency stabilization and linewidth reduction of the field spectrum of the laser, and also the fine detuning of the stabilized center frequency.
For the heterodyne frequency locking between two lasers, a spectroscopic method of using a Doppler‐free spectrum of the three‐level atomic vapor, obtained by using the phenomenon of coherent population trapping, is shown. In order to realize a highly efficient nonlinear optical frequency conversion for wideband frequency sweep of semiconductor lasers, a method of adding the output powers of several lasers, i.e., the coherent addition, is presented. After emphasizing that the wideband frequency sweep (covering from the near‐infrared to the visible region) can be realized by using the techniques of nonlinear optical frequency conversions and the optical phase locking, relevant experimental results of nonlinear optical frequency conversions are presented which are the second harmonics generation, sum and difference frequency conversions. A highly accurate optical frequency measurement system is proposed using an optical frequency comb generator with a modulation sidebands up to several THz. Performances of the optical frequency comb generator used for this system are presented. As a candidate for an ultrafast and wavelength insensitive photodetector for optical frequency counting, nonbolometric optical response characteristics of a high transition temperature (Tc) oxide superconducting film are demonstrated.  
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42.55.Px Semiconductor lasers; laser diodes
42.60.Fc Modulation, tuning, and mode locking

Quantum‐well infrared photodetectors

B. F. Levine

J. Appl. Phys. 74, R1 (1993); http://dx.doi.org/10.1063/1.354252 (81 pages)

Online Publication Date: 12 December 2006

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The extensive literature on quantum‐well infrared photodetectors (QWIPs) is reviewed. A detailed discussion is given on the device physics of the intersubband absorption and hot‐carrier transport processes for individual detectors, as well as the high performance which has been achieved for large staring arrays. QWIPs having widely different structures, materials, and spectral responses are covered, as is the optimization of the quantum‐well parameters for maximum performance.  
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85.60.Gz Photodetectors (including infrared and CCD detectors)
78.66.-w Optical properties of specific thin films

Dimensional metrology with scanning probe microscopes

Joseph E. Griffith and David A. Grigg

J. Appl. Phys. 74, R83 (1993); http://dx.doi.org/10.1063/1.354175 (27 pages)

Online Publication Date: 12 December 2006

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We review the application of scanning probe microscopes to dimensional measurement of topographic features. Probe microscopes show great promise as metrology tools because they produce three‐dimensional data over almost all solids in a wide range of ambients. Even though these microscopes readily achieve atomic resolution, there are several aspects of their behavior that can cause them to exhibit large measurement errors. The actuators that drive the probe exhibit hysteresis and creep, so they must be independently monitored. In addition, the geometry of an extended probe moving across the surface makes probe‐sample interaction intrinsically nonlinear. Forces on the probe that cause it to flex are another source of inaccuracy. Probe fabrication and characterization are, consequently, important issues. We describe present understanding of these problems and the techniques being developed to solve them.
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07.78.+s Electron, positron, and ion microscopes; electron diffractometers
07.60.Pb Conventional optical microscopes
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.37.Ps Atomic force microscopy (AFM)
68.37.Rt Magnetic force microscopy (MFM)
68.37.Uv Near-field scanning microscopy and spectroscopy
06.20.-f Metrology

Novel magnetic applications of high‐Tc bulk superconductors: Lenses for electron beams

Hidenori Matsuzawa

J. Appl. Phys. 74, R111 (1993); http://dx.doi.org/10.1063/1.354944 (21 pages)

Online Publication Date: 12 December 2006

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This paper presents a review on the latest state of the novel bulk devices, with an emphasis on lenses for electron beams. As one application of high critical‐temperature (Tc) bulk superconductors, the author proposed the lenses (Supertrons) and his group has developed them. The principle of the lenses is simple: When one injects electron beams into narrow superconducting tubes, the tubes confine the self‐magnetic field of the beams to the bore of the tubes because of the Meissner effect. The enhanced field accordingly focuses the beams into thinner ones. The first two sections outline high‐Tc superconducting materials and fundamental characteristics of electron beams. In the body of this article, the lenses are evaluated according to the focusing of intense electron beams (∼340 keV, ∼1 kA, ∼10 ns) and assigned a figure of merit. Lenses were made from powder‐pressed yttrium‐ (Tc=∼90 K), bismuth‐ (∼105 K), thallium‐ (∼120 K), and melt‐processed yttrium‐based superconductors. From the experimental results, one can say that powder‐pressed lenses are suitable for short pulsed, low repetition‐rate electron beams (a ferrite‐core model) and that melt‐processed lenses are, on the other hand, probably appropriate for continuous or slowly time‐varying electron beams. In addition to the temperature‐dependent focusing of the electron beams, a criterion for design of the lenses is discussed. To show the potential of the lenses, two applications of the lenses are described: a wiggler for free‐electron lasers and an electron‐beam guide for induction linear accelerators. Finally, other novel applications (current leads, magnets, and bearings) indicate the interest in bulk materials which are rapidly being developed. The review will provide fundamentals for potential applications of bulk superconductors.
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85.25.-j Superconducting devices
74.72.-h Cuprate superconductors
41.85.-p Beam optics
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